diff options
Diffstat (limited to 'drivers/mtd/tests/sprd_mtdtest/nandflash_agetest')
3 files changed, 266 insertions, 0 deletions
diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/Makefile b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/Makefile new file mode 100755 index 00000000..f18a8597 --- /dev/null +++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/Makefile @@ -0,0 +1 @@ +obj-m += nandflash_agetest.o diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/nandflash_agetest.c b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/nandflash_agetest.c new file mode 100755 index 00000000..5963a6ba --- /dev/null +++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/nandflash_agetest.c @@ -0,0 +1,250 @@ +#include <linux/init.h> +#include <linux/slab.h> +#include <linux/types.h> +#include <linux/moduleparam.h> +#include <linux/kernel.h> +#include <linux/module.h> +#include <linux/mtd/mtd.h> +#include <linux/mtd/nand.h> +#include <linux/delay.h> +#include <asm/div64.h> +#include <linux/err.h> +#include <linux/random.h> +#include <linux/vmalloc.h> + +#undef pr_fmt +#define pr_fmt(fmt) KBUILD_MODNAME ": " fmt + +static int dev = 4; +module_param(dev, int, S_IRUGO); +MODULE_PARM_DESC(dev, "MTD device number to use"); + +static int ebcnt = 0; +static int pgcnt = 0; +static unsigned char *bbt = NULL; +static struct mtd_info *mtd = NULL; +static struct rnd_state rnd_state = {0}; + +static int agetest_erase_eraseblock(unsigned int ebnum) +{ + int err = 0; + struct erase_info ei = {0}; + + ei.mtd = mtd; + ei.addr = ebnum * mtd->erasesize; + ei.len = mtd->erasesize; + + err = mtd_erase(mtd, &ei); + if (err) { + pr_err("err %d while erasing EB %d\n", err, ebnum); + return err; + } + + if (ei.state == MTD_ERASE_FAILED) { + pr_err("some erase error occurred at EB %d\n", ebnum); + return -EIO; + } + + return 0; +} + +static int agetest_scan_bad_block(void) +{ + unsigned int i = 0, bad = 0; + + bbt = (unsigned char *)vmalloc(ebcnt); + if (!bbt) { + pr_info("error: cannot allocate memory\n"); + return -ENOMEM; + } + + pr_info("scanning for bad eraseblocks first\n"); + for (i = 0; i < ebcnt; ++i) { + bbt[i] = mtd_block_isbad(mtd, i * mtd->erasesize) ? 1 : 0; + if (bbt[i]) + bad += 1; + cond_resched(); + } + pr_info("scanned %d eraseblocks, %d are bad\n", ebcnt, bad); + return 0; +} + +static int nandflash_agetest(void) +{ + int err = 0; + loff_t addr = 0; + unsigned int test_blk = 10; + unsigned int op = 0; + unsigned char *readbuf = NULL; + unsigned char *writebuf = NULL; + unsigned int written = 0, read = 0; + unsigned int continue_err = 0; + unsigned int erase_time = 0; + + readbuf = vmalloc(mtd->writesize); + if(!readbuf) { + pr_err("%s, alloc readbuf failed!\n", __func__); + err = -ENOMEM; + goto out; + } + + writebuf = vmalloc(mtd->writesize); + if(!writebuf) { + pr_err("%s, alloc writebuf failed!\n", __func__); + err = -ENOMEM; + goto out; + } + + while((test_blk < ebcnt) && bbt[test_blk]) { + test_blk ++; + } + + if(test_blk >= ebcnt) { + pr_err("The whole mtd_partion are bad!\n"); + err = -EINVAL; + goto out; + } + + pr_info("Begin to make block %d as bad!\n", test_blk); + addr = test_blk * mtd->erasesize; + prandom_seed_state(&rnd_state, 1); + prandom_bytes_state(&rnd_state, writebuf, mtd->writesize); + err = agetest_erase_eraseblock(test_blk); + if(err) { + pr_err("the first erase failed at addr: 0x%.8x, err: %d\n", (unsigned int)addr, err); + goto out; + } + + while(1) { + if(signal_pending(current)) + goto out; + err = mtd_write(mtd, addr, mtd->writesize, &written, writebuf); + if(err || written != mtd->writesize) { + pr_err("write failed at addr: 0x%.8x, err: %d, written: %d, time: %d\n", (unsigned int)addr, err, written, op); + goto erase; + } + + err = mtd_read(mtd, addr, mtd->writesize, &read, readbuf); + if(err || read != mtd->writesize) { + pr_err("read failed at addr: 0x%.8x, err: %d, read: %d, time: %d\n", (unsigned int)addr, err, read, op); + goto erase; + } + + if(memcmp(readbuf, writebuf, mtd->writesize) != 0) { + pr_err("verify failed at addr: 0x%.8x!", (unsigned int)addr); + goto erase; + } + +erase: + err = agetest_erase_eraseblock(test_blk); + if(err) { + pr_err("erase failed at addr: 0x%.8x, err: %d, time: %d\n", (unsigned int)addr, err, op); + break; + } + op += 1; + if(op % 1024 == 0) + pr_info("we have erased %d times!\n", op); + } + +/*make sure the block has been erased as bad block*/ + while(1) { + if(signal_pending(current)) + break; + err = mtd_write(mtd, addr, mtd->writesize, &written, writebuf); + err = agetest_erase_eraseblock(test_blk); + if(err) { + continue_err ++; + if(continue_err >= 0x1000) { + pr_info("after %d times continue erase, the block has been erased as bad block!", erase_time); + break; + } + if( continue_err % 100 == 0) + pr_info("the continue_err is %d!", continue_err); + } else { + if(continue_err) + pr_info("the continue_err may be clean, old value is %d\n", continue_err); + continue_err = 0; + } + erase_time ++; + if( erase_time % 1024 == 0) + pr_info("the erase_time is %d!", erase_time); + } + pr_info("mark block %d as bad!\n", test_blk); + mtd->_block_markbad(mtd, addr); + err = 0; + +out: + vfree(readbuf); + vfree(writebuf); + pr_info("agetest finished, %d(%d) operations done!\n", op, erase_time); + return err; +} + +static int __init nandflash_agetest_init(void) +{ + int err = 0; + uint64_t tmp = 0; + + pr_info(KERN_INFO "\n"); + pr_info(KERN_INFO "=================================================\n"); + + if (dev < 0) { + pr_info("Please specify a valid mtd-device via module parameter\n"); + return -EINVAL; + } + + pr_info("MTD device: %d\n", dev); + + mtd = get_mtd_device(NULL, dev); + if (IS_ERR(mtd)) { + err = PTR_ERR(mtd); + pr_info("error: cannot get MTD device\n"); + return err; + } + if (mtd->type != MTD_NANDFLASH) { + pr_info("this test requires NAND flash\n"); + goto out; + } + + tmp = mtd->size; + do_div(tmp, mtd->erasesize); + ebcnt = tmp; + pgcnt = mtd->erasesize / mtd->writesize; + + pr_info("MTD device size %llu, eraseblock size %u, " + "page size %u, count of eraseblocks %u, pages per " + "eraseblock %u, OOB size %u\n", + (unsigned long long)mtd->size, mtd->erasesize, + mtd->writesize, ebcnt, pgcnt, mtd->oobsize); + + err = agetest_scan_bad_block(); + if (err) + goto out; + + err = nandflash_agetest(); + if(err) { + pr_err("stresstest failed!\n"); + goto out; + } + +out: + pr_info(KERN_INFO "=================================================\n"); + if(bbt != NULL) + vfree(bbt); + put_mtd_device(mtd); + + return -1; +} + +static void __exit nandflash_agetest_exit(void) +{ + return; +} + +module_init(nandflash_agetest_init); + +module_exit(nandflash_agetest_exit); + +MODULE_DESCRIPTION("mtd_age_test"); +MODULE_AUTHOR("ming.tang@spreadtrum.com"); +MODULE_LICENSE("GPL"); diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/readme.txt b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/readme.txt new file mode 100755 index 00000000..91a5977f --- /dev/null +++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/readme.txt @@ -0,0 +1,15 @@ +agetest， 即老化测试，用于获取单个nandflash 擦除块的寿命。该测试需要的时间较长，一般需要5小时以上，由nandflash的特性决定。为了确保被测试擦除块彻底被擦坏，需要使用强制擦除接口（将/sys/kernel/debug/nfc_base/allowEraseBadBlock置为1）。
+
+参数说明：
+dev:用于指定测试使用的mtd分区，默认值为4
+
+使用方法：
+1 将/sys/kernel/debug/nfc_base/allowEraseBadBlock置为1；
+cmd:echo "1" > /sys/kernel/debug/nfc_base/allowEraseBadBlock
+2 root后加载测试模块并传入参数，测试结果通过kernel log输出，通过erase_time来衡量某款nandflash的特性;
+cmd:insmod nandflash_agetest.ko dev=4
+3 将/sys/kernel/debug/nfc_base/allowEraseBadBlock置为0。
+cmd:echo "0" > /sys/kernel/debug/nfc_base/allowEraseBadBlock
+
+注意：
+每进行一次测试，会增加一个bad block。
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