Initial file dump from open source releaseHEADmaster

3 files changed, 266 insertions, 0 deletions

diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/Makefile b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/Makefile
new file mode 100755
index 00000000..f18a8597
--- /dev/null
+++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/Makefile
@@ -0,0 +1 @@
+obj-m += nandflash_agetest.o
diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/nandflash_agetest.c b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/nandflash_agetest.c
new file mode 100755
index 00000000..5963a6ba
--- /dev/null
+++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/nandflash_agetest.c
@@ -0,0 +1,250 @@
+#include <linux/init.h>
+#include <linux/slab.h>
+#include <linux/types.h>
+#include <linux/moduleparam.h>
+#include <linux/kernel.h>
+#include <linux/module.h>
+#include <linux/mtd/mtd.h>
+#include <linux/mtd/nand.h>
+#include <linux/delay.h>
+#include <asm/div64.h>
+#include <linux/err.h>
+#include <linux/random.h>
+#include <linux/vmalloc.h>
+
+#undef pr_fmt
+#define pr_fmt(fmt) KBUILD_MODNAME ": " fmt
+
+static int dev = 4;
+module_param(dev, int, S_IRUGO);
+MODULE_PARM_DESC(dev, "MTD device number to use");
+
+static int ebcnt = 0;
+static int pgcnt = 0;
+static unsigned char *bbt = NULL;
+static struct mtd_info *mtd = NULL;
+static struct rnd_state rnd_state = {0};
+
+static int agetest_erase_eraseblock(unsigned int ebnum)
+{
+	int err = 0;
+	struct erase_info ei = {0};
+
+	ei.mtd  = mtd;
+	ei.addr = ebnum * mtd->erasesize;
+	ei.len  = mtd->erasesize;
+
+	err = mtd_erase(mtd, &ei);
+	if (err) {
+		pr_err("err %d while erasing EB %d\n", err, ebnum);
+		return err;
+	}
+
+	if (ei.state == MTD_ERASE_FAILED) {
+		pr_err("some erase error occurred at EB %d\n", ebnum);
+		return -EIO;
+	}
+
+	return 0;
+}
+
+static int agetest_scan_bad_block(void)
+{
+	unsigned int i = 0, bad = 0;
+
+	bbt = (unsigned char *)vmalloc(ebcnt);
+	if (!bbt) {
+		pr_info("error: cannot allocate memory\n");
+		return -ENOMEM;
+	}
+
+	pr_info("scanning for bad eraseblocks first\n");
+	for (i = 0; i < ebcnt; ++i) {
+		bbt[i] = mtd_block_isbad(mtd, i * mtd->erasesize) ? 1 : 0;
+		if (bbt[i])
+			bad += 1;
+		cond_resched();
+	}
+	pr_info("scanned %d eraseblocks, %d are bad\n", ebcnt, bad);
+	return 0;
+}
+
+static int nandflash_agetest(void)
+{
+	int err = 0;
+	loff_t addr = 0;
+	unsigned int test_blk = 10;
+	unsigned int op = 0;
+	unsigned char *readbuf = NULL;
+	unsigned char *writebuf = NULL;
+	unsigned int written = 0, read = 0;
+	unsigned int continue_err = 0;
+	unsigned int erase_time = 0;
+
+	readbuf = vmalloc(mtd->writesize);
+	if(!readbuf) {
+		pr_err("%s, alloc readbuf failed!\n", __func__);
+		err = -ENOMEM;
+		goto out;
+	}
+
+	writebuf = vmalloc(mtd->writesize);
+	if(!writebuf) {
+		pr_err("%s, alloc writebuf failed!\n", __func__);
+		err = -ENOMEM;
+		goto out;
+	}
+
+	while((test_blk < ebcnt) && bbt[test_blk]) {
+		test_blk ++;
+	}
+
+	if(test_blk >= ebcnt) {
+		pr_err("The whole mtd_partion are bad!\n");
+		err = -EINVAL;
+		goto out;
+	}
+
+	pr_info("Begin to make block %d as bad!\n", test_blk);
+	addr = test_blk * mtd->erasesize;
+	prandom_seed_state(&rnd_state, 1);
+	prandom_bytes_state(&rnd_state, writebuf, mtd->writesize);
+	err = agetest_erase_eraseblock(test_blk);
+	if(err) {
+		pr_err("the first erase failed at addr: 0x%.8x, err: %d\n", (unsigned int)addr, err);
+		goto out;
+	}
+
+	while(1) {
+		if(signal_pending(current))
+			goto out;
+		err = mtd_write(mtd, addr, mtd->writesize, &written, writebuf);
+		if(err || written != mtd->writesize) {
+			pr_err("write failed at addr: 0x%.8x, err: %d, written: %d, time: %d\n", (unsigned int)addr, err, written, op);
+			goto erase;
+		}
+
+		err = mtd_read(mtd, addr, mtd->writesize, &read, readbuf);
+		if(err || read != mtd->writesize) {
+			pr_err("read failed at addr: 0x%.8x, err: %d, read: %d, time: %d\n", (unsigned int)addr, err, read, op);
+			goto erase;
+		}
+
+		if(memcmp(readbuf, writebuf, mtd->writesize) != 0) {
+			pr_err("verify failed at addr: 0x%.8x!", (unsigned int)addr);
+			goto erase;
+		}
+
+erase:
+		err = agetest_erase_eraseblock(test_blk);
+		if(err) {
+			pr_err("erase failed at addr: 0x%.8x, err: %d, time: %d\n", (unsigned int)addr, err, op);
+			break;
+		}
+		op += 1;
+		if(op % 1024 == 0)
+			pr_info("we have erased %d times!\n", op);
+	}
+
+/*make sure the block has been erased as bad block*/
+	while(1) {
+		if(signal_pending(current))
+			break;
+		err = mtd_write(mtd, addr, mtd->writesize, &written, writebuf);
+		err = agetest_erase_eraseblock(test_blk);
+		if(err) {
+			continue_err ++;
+			if(continue_err >= 0x1000) {
+				pr_info("after %d times continue erase, the block has been erased as bad block!", erase_time);
+				break;
+			}
+			if( continue_err % 100 == 0)
+				pr_info("the continue_err is %d!", continue_err);
+		} else {
+			if(continue_err)
+				pr_info("the continue_err may be clean, old value is %d\n", continue_err);
+			continue_err = 0;
+		}
+		erase_time ++;
+		if( erase_time % 1024 == 0)
+				pr_info("the erase_time is %d!", erase_time);
+	}
+	pr_info("mark block %d as bad!\n", test_blk);
+	mtd->_block_markbad(mtd, addr);
+	err = 0;
+
+out:
+	vfree(readbuf);
+	vfree(writebuf);
+	pr_info("agetest finished, %d(%d) operations done!\n", op, erase_time);
+	return err;
+}
+
+static int __init nandflash_agetest_init(void)
+{
+	int err = 0;
+	uint64_t tmp = 0;
+
+	pr_info(KERN_INFO "\n");
+	pr_info(KERN_INFO "=================================================\n");
+
+	if (dev < 0) {
+		pr_info("Please specify a valid mtd-device via module parameter\n");
+		return -EINVAL;
+	}
+
+	pr_info("MTD device: %d\n", dev);
+
+	mtd = get_mtd_device(NULL, dev);
+	if (IS_ERR(mtd)) {
+		err = PTR_ERR(mtd);
+		pr_info("error: cannot get MTD device\n");
+		return err;
+	}
+	if (mtd->type != MTD_NANDFLASH) {
+		pr_info("this test requires NAND flash\n");
+		goto out;
+	}
+
+	tmp = mtd->size;
+	do_div(tmp, mtd->erasesize);
+	ebcnt = tmp;
+	pgcnt = mtd->erasesize / mtd->writesize;
+
+	pr_info("MTD device size %llu, eraseblock size %u, "
+	       "page size %u, count of eraseblocks %u, pages per "
+	       "eraseblock %u, OOB size %u\n",
+	       (unsigned long long)mtd->size, mtd->erasesize,
+	       mtd->writesize, ebcnt, pgcnt, mtd->oobsize);
+
+	err = agetest_scan_bad_block();
+	if (err)
+		goto out;
+
+	err = nandflash_agetest();
+	if(err) {
+		pr_err("stresstest failed!\n");
+		goto out;
+	}
+
+out:
+	pr_info(KERN_INFO "=================================================\n");
+	if(bbt != NULL)
+		vfree(bbt);
+	put_mtd_device(mtd);
+
+	return -1;
+}
+
+static void __exit nandflash_agetest_exit(void)
+{
+	return;
+}
+
+module_init(nandflash_agetest_init);
+
+module_exit(nandflash_agetest_exit);
+
+MODULE_DESCRIPTION("mtd_age_test");
+MODULE_AUTHOR("ming.tang@spreadtrum.com");
+MODULE_LICENSE("GPL");
diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/readme.txt b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/readme.txt
new file mode 100755
index 00000000..91a5977f
--- /dev/null
+++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_agetest/readme.txt
@@ -0,0 +1,15 @@
+agetest， 即老化测试，用于获取单个nandflash 擦除块的寿命。该测试需要的时间较长，一般需要5小时以上，由nandflash的特性决定。为了确保被测试擦除块彻底被擦坏，需要使用强制擦除接口（将/sys/kernel/debug/nfc_base/allowEraseBadBlock置为1）。

+

+参数说明：

+dev:用于指定测试使用的mtd分区，默认值为4

+

+使用方法：

+1 将/sys/kernel/debug/nfc_base/allowEraseBadBlock置为1；

+cmd:echo "1" > /sys/kernel/debug/nfc_base/allowEraseBadBlock

+2 root后加载测试模块并传入参数，测试结果通过kernel log输出，通过erase_time来衡量某款nandflash的特性;

+cmd:insmod nandflash_agetest.ko dev=4

+3 将/sys/kernel/debug/nfc_base/allowEraseBadBlock置为0。

+cmd:echo "0" > /sys/kernel/debug/nfc_base/allowEraseBadBlock

+

+注意：

+每进行一次测试，会增加一个bad block。
\ No newline at end of file