diff options
| author | Yuval Adam <_@yuv.al> | 2017-08-30 08:25:59 +0000 |
|---|---|---|
| committer | Yuval Adam <_@yuv.al> | 2017-08-30 08:25:59 +0000 |
| commit | 8e4bff4cab0ddac6060645b0715210484d02ff40 (patch) | |
| tree | 3a5c3024371a04692a3a6d9974d001cdff8ebf84 /drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest | |
Diffstat (limited to 'drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest')
3 files changed, 374 insertions, 0 deletions
diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/Makefile b/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/Makefile new file mode 100755 index 00000000..ba65c86b --- /dev/null +++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/Makefile @@ -0,0 +1 @@ +obj-m += nandflash_bitfliptest.o diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/nandflash_bitfliptest.c b/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/nandflash_bitfliptest.c new file mode 100755 index 00000000..a7c926bb --- /dev/null +++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/nandflash_bitfliptest.c @@ -0,0 +1,364 @@ +#include <linux/init.h>
+#include <linux/slab.h>
+#include <linux/fs.h>
+#include <asm/uaccess.h>
+#include <linux/types.h>
+#include <linux/moduleparam.h>
+#include <linux/kernel.h>
+#include <linux/module.h>
+#include <linux/mtd/mtd.h>
+#include <linux/delay.h>
+#include <asm/div64.h>
+#include <linux/err.h>
+#include <linux/sched.h>
+#include <linux/random.h>
+#include <linux/vmalloc.h>
+
+#undef pr_fmt
+#define pr_fmt(fmt) KBUILD_MODNAME ": " fmt
+
+struct mtd_part {
+ struct mtd_info mtd;
+ struct mtd_info *master;
+ loff_t offset;
+ struct list_head list;
+};
+static int dev = 4;
+static int threshold = 100;
+module_param(dev, int, S_IRUGO);
+module_param(threshold, int, S_IRUGO);
+MODULE_PARM_DESC(dev, "MTD device number to use");
+MODULE_PARM_DESC(threshold, "the threshold of bit-flip num");
+
+static struct mtd_info *mtd = NULL;
+static struct mtd_part *mtd_part = NULL;
+static unsigned char *bbt = NULL;
+
+static int ebcnt;
+static int pgcnt;
+static int errcnt;
+static int rdcnt;
+static int rdpgcnt;
+static int pgsize;
+static int bufsize;
+static int *offsets;
+static unsigned char *readbuf;
+static unsigned char * writebuf;
+
+static int mtd_test_erase_eraseblock(int ebnum, int blocks)
+{
+ int err = 0;
+ struct erase_info ei = {0};
+
+ if(blocks == 0)
+ blocks = 1;
+
+ ei.mtd = mtd;
+ ei.addr = ebnum * mtd->erasesize;
+ ei.len = mtd->erasesize * blocks;
+
+ err = mtd_erase(mtd, &ei);
+ if (err) {
+ pr_err("error %d while erasing EB %d\n", err, ebnum);
+ return err;
+ }
+
+ if (ei.state == MTD_ERASE_FAILED) {
+ pr_err("Some erase error occurred at EB %d\n", ebnum);
+ return -EIO;
+ }
+
+ return 0;
+}
+
+static int mtd_test_erase_whole_device(void)
+{
+ int err = 0;
+ unsigned int i = 0;
+
+ for (i = 0; i < ebcnt; ++i) {
+ if (bbt[i])
+ continue;
+ err = mtd_test_erase_eraseblock(i, 0);
+ if (err)
+ return err;
+ cond_resched();
+ }
+ return 0;
+}
+
+static int mtd_test_scan_bad_block(void)
+{
+ unsigned int i = 0, bad = 0;
+
+ bbt = (unsigned char *)vmalloc(ebcnt);
+ if (!bbt) {
+ pr_info("error: cannot allocate memory\n");
+ return -ENOMEM;
+ }
+
+ pr_info("scanning for bad eraseblocks first\n");
+ for (i = 0; i < ebcnt; ++i) {
+ bbt[i] = mtd_block_isbad(mtd, i * mtd->erasesize) ? 1 : 0;
+ if (bbt[i])
+ bad += 1;
+ cond_resched();
+ }
+ pr_info("scanned %d eraseblocks, %d are bad\n", ebcnt, bad);
+ return 0;
+}
+
+static int bitfliptest_rand_eb(void)
+{
+ unsigned int eb = 0;
+
+again:
+ eb = prandom_u32();
+ /* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
+ eb %= (ebcnt - 1);
+ if (bbt[eb])
+ goto again;
+ return eb;
+}
+
+static int bitfliptest_rand_offs(void)
+{
+ unsigned int offs = 0;
+
+ offs = prandom_u32();
+ offs %= bufsize;
+ return offs;
+}
+
+static int bitfliptest_rand_len(int offs)
+{
+ unsigned int len = 0;
+
+ len = prandom_u32();
+ len %= (bufsize - offs);
+ return len;
+}
+
+static int bitfliptest_do_read(void)
+{
+ int err = 0;
+ size_t read = 0;
+ loff_t addr = 0;
+ unsigned int corrected_num = 0;
+ unsigned int eb = bitfliptest_rand_eb();
+ unsigned int offs = bitfliptest_rand_offs();
+ unsigned int len = bitfliptest_rand_len(offs);
+ struct mtd_ecc_stats stats= {0};
+
+ if (bbt[eb + 1]) {
+ if (offs >= mtd->erasesize)
+ offs -= mtd->erasesize;
+ if (offs + len > mtd->erasesize)
+ len = mtd->erasesize - offs;
+ }
+ addr = eb * mtd->erasesize + offs;
+
+// pr_info("read, addr: 0x%.8x len: %d\n", (unsigned int)addr, len);
+ stats = mtd_part->master->ecc_stats;
+ err = mtd_read(mtd, addr, len, &read, readbuf);
+ if (mtd_is_bitflip(err))
+ err = 0;
+ if (unlikely(err || read != len)) {
+ pr_err("error: read failed at 0x%llx, err:%d len: %dread:%d\n",
+ (long long)addr, err, len, read);
+ if (!err)
+ err = -EINVAL;
+ return err;
+ }
+ corrected_num = mtd_part->master->ecc_stats.corrected - stats.corrected;
+ if(corrected_num != 0) {
+ errcnt += corrected_num;
+ pr_info("When we read addr:0x%.8x:0x%.8x, we found %d(%d) bit-flip!\n", (unsigned int)addr, len, corrected_num, errcnt);
+ }
+ rdpgcnt += len/mtd->writesize;
+ rdcnt ++;
+ return 0;
+}
+
+static int bitfliptest_do_write(void)
+{
+ int err = 0;
+ loff_t addr = 0;
+ size_t written = 0;
+ int eb = bitfliptest_rand_eb();
+ unsigned int offs = 0, len = 0;
+
+ offs = offsets[eb];
+ if (offs >= mtd->erasesize) {
+ err = mtd_test_erase_eraseblock(eb, 0);
+ if (err)
+ return err;
+ offs = offsets[eb] = 0;
+ }
+ len = bitfliptest_rand_len(offs);
+ len = ((len + pgsize - 1) / pgsize) * pgsize;
+ if (offs + len > mtd->erasesize) {
+ if (bbt[eb + 1])
+ len = mtd->erasesize - offs;
+ else {
+// pr_info("erase, block: %d\n", eb + 1);
+ err = mtd_test_erase_eraseblock(eb + 1, 0);
+ if (err)
+ return err;
+ offsets[eb + 1] = 0;
+ }
+ }
+ addr = eb * mtd->erasesize + offs;
+// pr_info("write, addr: 0x%.8x len: %d\n", (unsigned int)addr, len);
+ err = mtd_write(mtd, addr, len, &written, writebuf);
+ if (unlikely(err || written != len)) {
+ pr_err("error: write failed at 0x%llx\n",
+ (long long)addr);
+ if (!err)
+ err = -EINVAL;
+ return err;
+ }
+ offs += len;
+ while (offs > mtd->erasesize) {
+ offsets[eb++] = mtd->erasesize;
+ offs -= mtd->erasesize;
+ }
+ offsets[eb] = offs;
+ return 0;
+}
+
+static int bitfliptest_do_operation(void)
+{
+ if (prandom_u32() & 1) {
+ return bitfliptest_do_read();
+ } else {
+ return bitfliptest_do_write();
+ }
+}
+
+static int mtd_test_bitfliptest(void)
+{
+ int err = 0;
+ unsigned int i = 0, op = 0;
+
+ bufsize = mtd->erasesize * 2;
+ readbuf = vmalloc(bufsize);
+ if(!readbuf) {
+ pr_err("%s, alloc readbuf failed!\n", __func__);
+ return -ENOMEM;
+ }
+ writebuf = vmalloc(bufsize);
+ if(!writebuf) {
+ pr_err("%s, alloc writebuf failed!\n", __func__);
+ vfree(readbuf);
+ return -ENOMEM;
+ }
+ offsets = vmalloc(ebcnt * sizeof(int));
+ if(!offsets) {
+ pr_err("%s, alloc offsets failed!\n", __func__);
+ vfree(readbuf);
+ vfree(writebuf);
+ return -ENOMEM;
+ }
+ pr_info("bitfliptest begin!\n");
+
+ for (i = 0; i < ebcnt; i++)
+ offsets[i] = mtd->erasesize;
+ prandom_bytes(writebuf, bufsize);
+
+ err = mtd_test_erase_whole_device();
+ if(err)
+ goto out;
+
+ while(1) {
+ if ((op & 1023) == 0)
+ pr_info("%d operations done\n", op);
+ err = bitfliptest_do_operation();
+ if (err)
+ goto out;
+ if(errcnt >= threshold) {
+ pr_info("Test times: %d, read times: %d, read pages: %d, bit-flip: %d.\n", op, rdcnt, rdpgcnt, errcnt);
+ break;
+ }
+ cond_resched();
+ op += 1;
+ }
+
+out:
+ vfree(offsets);
+ vfree(readbuf);
+ vfree(writebuf);
+ pr_info("bitfliptest finished, %d operations done!\n", op);
+ return err;
+}
+
+static int __init nandflash_bitfliptest_init(void)
+{
+ int err = 0;
+ uint64_t tmp = 0;
+
+ pr_info(KERN_INFO "\n");
+ pr_info(KERN_INFO "=================================================\n");
+
+ if (dev < 0) {
+ pr_info("Please specify a valid mtd-device via module parameter\n");
+ return -EINVAL;
+ }
+
+ pr_info("MTD device: %d\n", dev);
+
+ mtd = get_mtd_device(NULL, dev);
+ if (IS_ERR(mtd)) {
+ err = PTR_ERR(mtd);
+ pr_info("error: cannot get MTD device\n");
+ return err;
+ }
+ mtd_part = (struct mtd_part *)mtd;
+
+ if (mtd->type != MTD_NANDFLASH) {
+ pr_info("this test requires NAND flash\n");
+ goto out;
+ }
+
+ tmp = mtd->size;
+ do_div(tmp, mtd->erasesize);
+ ebcnt = tmp;
+ pgcnt = mtd->erasesize / mtd->writesize;
+ pgsize = mtd->writesize;
+
+ pr_info("MTD device size %llu, eraseblock size %u, "
+ "page size %u, count of eraseblocks %u, pages per "
+ "eraseblock %u, OOB size %u\n",
+ (unsigned long long)mtd->size, mtd->erasesize,
+ mtd->writesize, ebcnt, pgcnt, mtd->oobsize);
+
+ err = mtd_test_scan_bad_block();
+ if (err)
+ goto out;
+
+ err = mtd_test_bitfliptest();
+ if(err) {
+ pr_err("bitfliptest failed!\n");
+ goto out;
+ }
+
+out:
+ pr_info(KERN_INFO "=================================================\n");
+ if(bbt != NULL)
+ vfree(bbt);
+ put_mtd_device(mtd);
+
+ return -1;
+}
+
+static void __exit nandflash_bitfliptest_exit(void)
+{
+ return;
+}
+
+module_init(nandflash_bitfliptest_init);
+module_exit(nandflash_bitfliptest_exit);
+
+MODULE_DESCRIPTION("mtd_bitflip_test");
+MODULE_AUTHOR("ming.tang@spreadtrum.com");
+MODULE_LICENSE("GPL");
diff --git a/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/readme.txt b/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/readme.txt new file mode 100755 index 00000000..760e164f --- /dev/null +++ b/drivers/mtd/tests/sprd_mtdtest/nandflash_bitfliptest/readme.txt @@ -0,0 +1,9 @@ +bitfliptest——位翻转测试，用于测试当前系统在做数据存取时发生bit-flip的概率，测试时长由当前系统的稳定性和设定的阀值共同决定。
+
+参数说明：
+dev:用于指定测试使用的mtd分区，默认值为4
+threshold:用于指定bit-flip的阀值，即当bit-flip的总数达到阀值即会停止，默认值为100。
+
+使用方法：
+root后加载测试模块并传入参数，测试结果通过kernel log输出;
+cmd:insmod nandflash_bitfliptest.ko dev=4 threshold=100
\ No newline at end of file |